JD Instruments Testers
JD Instruments manufactures portable, “bench top” Integrated Circuit (IC) test systems that can test many different part types all from the same tester.
all these part types / one tester
- Memory Tester
- OpAmp Tester / Cmpr Tester
- Mixed Signal Tester
- Shorts-Open Tester
- ASIC [&SOC] Tester
- Curve Tracer
- Discrete Comp Tester
- Logic Circuit Tester
- Power (Reg, FET) Tester
JD Instruments Testers – Simpler to Use
Design and Test in Hours/Days – not – Weeks/Months:
with the capabilities of ‘BIG IRON’ ATE Testers
The JDi Tester can be configured with analog and digital test cards to create a range of systems to suit various applications…
Flexible Interface
JDI family DUT Boards
Standard Test Head
Large High Pin Count Test Head with extraction
Bench Testing, Thermal Testing, Remote Testing
Passive – No Test Head
User Custom DUT Boards
ATV Digital System
The ATV Digital Test System performs high speed testing and timing verification using algorithmically generated test vectors or patterns downloaded from ATPG (Automatic Test Pattern Generation). ATV can be used to test:
- Memories (SRAM, DRAM, FLASH, SDRAM, EEPROM, etc.)
- ASICs
- FPGAs
- PLDs
- Microprocessors
- Systems On a Chip
PWS Analog (I/V) System
Combo Tester (ATV + PWS – in same chassis)
All the above, plus.
- ADCs
- DACs
- Mixed Signal
- . . .
The testers can be operated interactively or test sequences can be automated through a built-in BASIC environment. Components can be tested at wafer level or in packages.
They can be remotely tested at distances up to 100 feet
ATE – (Automated Test Environment)
Control / Program JDI Testers
with ‘built-in’ visual BASIC
- Operator interfaces
- Control JDI testers and other instruments (with GPIB)
- Data Logs, Reports, Spread Sheets
- Plots, Reports, Analysis
with ‘built-in’ visual BASIC
JDI Test Sets
Off-the-shelf DUT Boards for important
technology groups
technology groups
Often, users will create their own DUT boards and test programs for testing a part. But there are some technology groups for which JDi provides off-the-shelf solutions which include DUT board sets and test programs. This is because those groups can be complex, requiring a lot of DUT board electronics, and because many part families can be accommodated from single solutions. The form factor of the JDi test sets are suitable for bench top, air stream, oven, and radiation test.
Test Sets Available
- OpAmp / Comparator
- ADC
- DAC
- x16 Memory ( for SRAM / FLASH / SDRAM / non Volatile Memories / Logic Devices …)
- Power (Regulators, Power FET, … )
Advanced IC Test Family Boards
for critical technology groups
Analog
• OpAmps
• Comparators
• PWM (coming)
Mixed Signal
• ADC
• DAC
Memory
• SRAM
• FLASH
• SDRAM
• EEPROM
• Logic
Power
• LDO Regulators
• FETs
turn key!
IC Test – Family Boards
Families:
- OpAmp/Cmpr
- Mixed Signal (ADC/DAC)
- Memory (+ Dig & Logic ckts)
- Power
- Full Test: DC, ac, Functional
- Thermal Test: Air Stream, Oven (with extender card)
- Single, Dual, Quad package support
- Multi-Site
- Includes Test Software and Part Libraries
Production Test, Radiation Test, etc
User extensible libraries via simple part definition screens
Family Test Board Set:
Load Board + various DUT Boards