Test vectors can be imported from ASCII files or they can be generated “real time” algorithmically. Algorithmic generation is powerful because millions of vectors can be generated from a few lines of code. This is especially important when testing memories or devices containing memory blocks.
Imported vectors are essential when testing complex devices such as ASICs.
With ATV, imported vectors and algorithmic generation can be combined to capture the best of both approaches. This can be important when testing SOC (System on a Chip) technologies.
ATV test vector algorithms are programmed in a simple integrated editor. These algorithms are compiled into high speed binaries which are downloaded to the ATV tester. The source language includes subroutines and interrupts. Procedure libraries are also implemented so test algorithms can be simply built by including existing common code.
An extensive library filled with working examples for many part families is included with the installation of the JDi software.