Digital IC - Semiconductor Analog I/V - Test Systems
The ATV Digital IC Test System performs high speed testing and timing verification using algorithmically generated test vectors or downloaded patterns (from ATPG, for example) It is a Memory Test System, Mixed Signal Test System, and SoC Test System all combined into one!
• Memories (SRAM, DRAM, FLASH, SDRAM, EEPROM … )
• ASICs,
• FPGAs, PLDs,
• Microprocessors, DSPs
• Systems On a Chip (SOC).
• Mixed Signal - ADCs, DACs
• DC Parametrics on digital devices (Voh, Iozh, etc.)
• Functional and AC test parameters
The PWS - Analog Tester is a precision semiconductor parameter analyzer, device analyzer and IV Test System. It has built-in switch matrices and picoamp Source Measure Units (SMU) (PMU).
Use it to test
• OpAmps
• Test Structures
• Analog Circuits
DTE (Dynamic Test Environment)
... manage the Test … ensure Data Integrity ... automate Sequences of Tests … Organize and Display Data
Rapid ATE Application Development
Automate your tests using built in BASIC. Rapid application development allows simple creation of programs which control
• JDI Digital and Analog Testers
• Other Lab Instruments (via GPIB - IEEE488.2)
Perform analysis, Data Log, Plotting, and create operator screens to ensure data integrity and allow turn-key operation of tests.
Use - Built In Templates
in data log template
• Template Programs - Add a few procedures for your part
.. and start testing.